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Analog Devices ADuM4177 | Demoboard EVAL-ADuM4177EBZ

40 A Source and 30 A Sink, SiC Isolated Gate Driver with Slew-Rate Control and BISTs

Details

TopologieSonstige Topologie

Beschreibung

The EVAL-ADuM4177EBZ evaluation board shows the advanced features of the ADuM4177 while maintaining flexibility in a testing environment. The EVAL ADuM4177EBZ evaluation board layout delivers a circuit that is easy to control through jumper pins andwith access to all of the pins through headers and input and output connectors. A more optimized layout is possible that increases the performance of the system.

Eigenschaften

  • 40 A (source), 30 A (sink) peak drive output capability
  • Output power device resistance: 0.38 Ω per MOSFET
  • Test infrastructure for
  • SPI communication
  • Slew-rate control
  • Desaturation detection
  • Miller drive
  • Active short-circuit
  • Temperature sensing
  • Fault reporting
  • Multiple dummy loads

Typische Anwendungen

  • Electric vehicles (EV) and hybrid electric vehicles (HEV) traction inverters
  • Switching power supplies
  • SiC, MOSFET, IGBT gate drivers, Industrial inverters , Power factor correctors

Weiterführende Informationen

Artikeldaten