IC-Hersteller Analog Devices

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Analog Devices ADL5324ARKZ | Demoboard EVAL-CN0551-EBZ

USB-Powered, 433.92 MHz RF Power Amplifier with Overtemperature Management

Details

TopologieSonstige Topologie

Beschreibung

The ADL5324 incorporates a dynamically adjustable biasing circuit that allows for the customization of OIP3 and P1dB performance from 3.3 V to 5 V, without the need for an external bias resistor. This feature gives the designer the ability to tailor driver amplifier performance to the specific needs of the design. This feature also creates the opportunity for dynamic biasing of the driver amplifier where a variable supply is used to allow for full 5 V biasing under large signal conditions, and then reduced supply voltage when signal levels are smaller and lower power consumption is desirable. This scalability reduces the need to evaluate and inventory multiple driver amplifiers for different output power requirements, from 25 dBm to 29 dBm output power levels.

Eigenschaften

  • +35 dB Gain
  • 433 MHz ISM Band Optimized
  • 50 Ohm Input and Output Impedance Matched
  • Over temperature Monitoring
  • Automatic Thermal Shutoff & Turn on

Typische Anwendungen

  • Intended for applications outside radio communications

Weiterführende Informationen

Artikeldaten

Artikel Nr. Daten­blatt Simu­lation Downloads Status ProduktserieLeiterplattendicke
(mm)
fMittelkontaktBetriebstemperaturL
(nH)
Tol. LTestbedingung LQmin.
(%)
Testbedingung QRDC max.
(Ω)
IR
(mA)
fres
(MHz)
Muster
744765056GASPEC
10 Dateien Aktiv i| Produktion ist aktiv. Erwartete Lebenszeit: >10 Jahre.WE-KI Keramik-SMT-Induktivität -40 °C up to +125 °C 5.6 ±0.2nH 250 MHz 23 250 MHz 0.083 760 5800
60312202114513SPEC
6 Dateien Aktiv i| Produktion ist aktiv. Erwartete Lebenszeit: >10 Jahre.WR-SMA PCB End Launch 1.6 DC~18 GHz Ø 0.51 WIDE x 0.25 THK -65 °C up to +165 °C
Artikel Nr. Daten­blatt Simu­lation
744765056GASPEC
60312202114513SPEC
Muster
Artikel Nr. Daten­blatt Simu­lation Downloads Status ProduktserieLeiterplattendicke
(mm)
fMittelkontaktBetriebstemperaturL
(nH)
Tol. LTestbedingung LQmin.
(%)
Testbedingung QRDC max.
(Ω)
IR
(mA)
fres
(MHz)
Muster