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Texas Instruments AMC3302-Q1

Automotive High-Precision, ±50-mV Input, Reinforced Isolated Amplifier With Integrated DC/DC Converter

Details

TopologieSonstige Topologie
IC-RevisionA

Beschreibung

The AMC3302-Q1 is a precision, isolated amplifier optimized for shunt-based current measurements. The fully integrated, isolated DC/DC converter allows single-supply operation from the low-side of the device, which makes the device a unique solution for space-constrained applications. The reinforced capacitive isolation barrier is certified according to VDE V 0884-11 and UL1577 and supports a working voltage of up to 1.2 kVRMS.

Eigenschaften

  • AEC-Q100 qualified for automotive applications:
  • Temperature grade 1: –40°C to +125°C, TA
  • 3.3-V or 5-V single supply with integrated DC/DC converter
  • ±50-mV input voltage range optimized for current measurement using shunt resistors
  • Fixed gain: 41
  • Low DC errors:
  • Offset voltage: ±50 µV (maximum)
  • Offset drift: ±0.5 µV/°C (maximum)
  • Gain error: ±0.2% (maximum)
  • Gain error drift: ±35 ppm/°C (maximum)
  • Nonlinearity: ±0.03% (maximum)
  • High CMTI: 95 kV/µs (minimum)
  • System-level diagnostic features
  • Meets CISPR-11 and CISPR-25 EMI standards
  • Safety-related certifications:
  • 6000-VPK reinforced isolation per DIN VDE V0884-11
  • 4250-VRMS isolation for 1 minute per UL1577

Typische Anwendungen

  • HEV/EV charging piles – HEV/EV on-board chargers (OBC) – HEV/EV DC/DC converters – HEV/EV traction inverters

Weiterführende Informationen

Artikeldaten

Artikel Nr. Daten­blatt Simu­lation Downloads Status ProduktserieZ @ 100 MHz
(Ω)
Zmax
(Ω)
Testbedingung ZmaxIR 2
(mA)
Testbedingung IR 2Z @ 1 GHz
(Ω)
Typ Muster
74269244182SPEC
9 Dateien Aktiv i| Produktion ist aktiv. Erwartete Lebenszeit: >10 Jahre.WE-TMSB SMT-Ferrit 1800 2700 450 MHz 210 ΔT = 40 K 1500 High Frequency
Artikel Nr. Daten­blatt Simu­lation
74269244182SPEC
Muster
Artikel Nr. Daten­blatt Simu­lation Downloads Status ProduktserieZ @ 100 MHz
(Ω)
Zmax
(Ω)
Testbedingung ZmaxIR 2
(mA)
Testbedingung IR 2Z @ 1 GHz
(Ω)
Typ Muster