OverviewAll product unitsProduct unitPassive ComponentsProduct groupEMC ComponentsProduct familyESD ProtectionProduct seriesWE-VEA ESD Suppressor-Array

WE-VEA ESD Suppressor-Array

WE-VEA ESD Suppressor-Array
Size Dimen­sionsL
(mm)
W
(mm)
H
(mm)
Mount
0508 2 1.2 0.725 SMT
0612 3.2 1.6 0.85 SMT

Characteristics

  • Fast response time (1 ns)
  • Low signal insertion loss
  • No leakage current
  • Low clamping voltage
  • Almost no energy consumption in stand-by mode
  • Excellent absorption for ESD-impulses
  • Operating temperature: –40 ºC to +85 ºC

Applications

  • Protection of data lines
  • Protection of bus systems
  • Protection of video transmission lines
  • Protection of semiconductors
  • ESD protection in accordance with EN 61000-4-2

Products

All
0508
0612
Order Code Data­sheet Downloads StatusChannelsVDC
(V)
ILeak
(µA)
SizeApplication Samples
82380050100SPEC
6 files Active i| Production is active. Expected lifetime: >10 years. 4 5 0.1 0508 Datalines, analog signals
82380180121SPEC
6 files Active i| Production is active. Expected lifetime: >10 years. 4 18 1 0612 RS-232, Sensors
Order Code Data­sheet
82380050100SPEC
82380180121SPEC
Samples
Order Code Data­sheet Downloads StatusChannelsVDC
(V)
ILeak
(µA)
SizeApplication Samples

New ESD diode model (also available with snapback)

Built on real measurement data

In cooperation with the IFE from TU Graz, WE now offers a diode model across all ESD protection components, built on real measurement data with TLP (Transmission Line Pulsing) to capture true device behavior under ESD conditions. Traditional models often use simplified approximations, like shown in the dotted line, while this model reflects actual transient characteristics like snapback delay and conductivity. Our Model can now also simulate the snapback behavior.

Key Advantages:

  • Simulate true transient behavior, allowing designs to be tested under realistic conditions and ensuring robust ESD protection.
  • Ready-to-use simulation files simplify integration into SPICE-based analyses, speeding up design cycles and time-to-market.
  • Reliable simulations reduce testing, development cycles, and the risk of product recalls due to ESD vulnerabilities, while providing insights into device behavior to enable design optimization and ensure consistent ESD resilience across applications, from consumer electronics to industrial devices.
Current-voltage diagram with simulated and real measured values

Videos

Würth Elektronik Webinar: Effective ESD protection with TVS diodes